"The goal of Failure Analysis 4.0 is to develop smart AI based tools for a mostly automated process chain for failure diagnostics integrating self-learning data analysis and defect detection and localization, standardized material analysis and centralized data acquisition and correlation to electrical performance data" - RISE.
Gimic is part of the development of Machine Learning algorithms for image processing of ultra high resolution X-ray images and visualization of the results. So far, we have published one paper on the subject: "Comparison of deep learning-based image segmentation methods for the detection of voids in X-ray images of microelectronic components". - Schiele et al. 2021
Do you want to read more about FA 4.0?
Read the article here: https://ieeexplore.ieee.org/document/9551671